Powder X-ray diffractometer (Rigaku's SmartLab)

machine specifications:

• X-ray source
  • Cu tube (40 kV, 30 mA)
  • Incident curved Ge monochrometer for Kα₁
  • Multilayer coating mirror for parallel beam
• Goniometer
  • theta-theta type (sample surface is always horizontal)
  • Sample stage: normal, horizontally rotating, and capillary rotating stage
• Detector
  • D/teX Ultra one-dimensional detector
  • Scintillation detector
• Measurements
  • Bragg-Brentano para-focus + D/teX for rapid measurement
  • Ka1 + Bragg-Brentano para-focus + D/teX
  • Ka1 + Parallel beam + capillary rotating stage + SC detector for crystal structure study
  • etc

applications:

• Identification of phases by ICDD database search
• Grain size and strain analysis
• Quantitative analysis of phases
• Lattice parameter refinement
• Structure determination of minerals
• Rietveld refinement

person whom users should contact: Masami Kanzaki