Powder X-ray diffractometer
Powder X-ray diffractometer (Rigaku's SmartLab) |
machine specifications:
- X-ray source
- Cu tube (40 kV, 30 mA)
- Incident curved Ge monochrometer for Kα1
- Multilayer coating mirror for parallel beam
- Goniometer
- theta-theta type (sample surface is always horizontal)
- Sample stage: normal, horizontally rotating, and capillary rotating stage
- Detector
- D/teX Ultra one-dimensional detector
- Scintillation detector
- Measurements
- Bragg-Brentano para-focus + D/teX for rapid measurement
- Ka1 + Bragg-Brentano para-focus + D/teX
- Ka1 + Parallel beam + capillary rotating stage + SC detector for crystal structure study
- etc
applications:
- Identification of phases
- Grain size and strain analysis
- Quantitative analysis of phases
- Lattice parameter refinement
- Structure determination of minerals
- Rietveld refinement
person whom users should contact: Masami Kanzaki